BRUKER NANO ANALYTICS PRESENTS: XFlash® 7 Detector Webinar Series Part I

Improving Efficiency with the XFlash® 7 EDS Detector Family

On-demand session - 41 minutes

ESPRIT LiveMap and the Fastest Quantitative and Qualitative Analysis Available

Join us for this webinar where we will present the benefits of the new XFlash® 7 detector family through various fields of applications. We will also introduce the workflow of ESPRIT LiveMap how to obtain real-time chemical imaging.

With the release of Bruker’s latest generation of EDS detectors, the XFlash® 7 family, analytical capabilities are exceeding past limitations.

In this webinar, we will present the key benefits of the new generation and explore applications such as high speed spectrum acquisition and signal processing.

In combination with the new ESPRIT LiveMap feature, the QUANTAX EDS system provides real-time chemical imaging to deliver the fastest, most reliable results, and the best quality data for your research.

Fast mapping of a welding seam at very high count rate

Who Should Attend?

  • Scientists and researchers from all analytical fields who interested in Energy Dispersive X-Ray Spectroscopy (EDS) technology for SEM and TEM
  • Everyone in materials science, life science and academia who is interested in elemental analysis

Speakers

Purvesh Soni

Application Scientist, Bruker Nano Analytics

Dr. Igor Nemeth

Application Scientist, Bruker Nano Analytics

*The On-Demand registration form is optimized to work with the browser Google Chrome.