Failure analysis of packaging materials

Failure Analysis of Packaging Materials

Application Note M112

Effective Failure Analysis of Packaging Materials

FT-IR microscopy is an attractive method for the analysis of failures in complex multi-layered packaging materials.

Read our application note to learn from real-life examples how to

Identify the chemical identity of defects in a packaging foil
Determine and visualize the homogeneity of a coating on a polymer film
Investigate the integrity of a cold sealing

Download our Application Note M112

* Please fill out the mandatory fields.

First Name Please enter your first name

Last Name Please enter your last name

Email Please enter a valid e-mail address

Phone number

Company/Institution Please enter your Company/Institution

Street

City

ZIP Code

Country or Area Please select your Country

State/Province Please select your State

Additional Comments

By submitting this form I confirm that I would like to be contacted by Bruker. I have taken note of the Bruker Website Privacy Notice and I agree to the Terms of Use of the Bruker website. Please accept the Terms and Conditions

Privacy Notice Terms of Use

* Please fill out the mandatory fields.

Ce site est protégé par reCAPTCHA de Google règles de confidentialité et les conditions d'utilisation le Captcha de Google s'applique sur un formulaire.

More information

Contact Information and Newsletter

BRUKER OPTICS OFFICES WORLDWIDE

Failure Analysis of Packaging Materials

Application Note M112

Effective Failure Analysis of Packaging Materials

Download our Application Note M112

More information

Contact Information and Newsletter

Bruker Optics Offices

Contact our Experts

Bruker Optics Global Newsletter