Hysitron Accelerated Property Mapping (XPM)

Bruker’s XPM sets a new industry standard in terms of nanomechanical testing throughput paired with measurement resolution and accuracy. With XPM, more data can be taken in a single afternoon than could be collected in an entire year using traditional nanoindentation methodologies. These exclusive performance capabilities are made possible by the coupling of three industry-leading Hysitron technologies: a high bandwidth electrostatically actuated transducer, fast control and data acquisition electronics, and top-down in-situ SPM imaging.

Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale.

XPM on the Hysitron TI 980 TriboIndenter can perform 6 nanoindentation measurements per second to achieve comprehensive quantitative nanomechanical property maps and property distribution statistics. 

XPM II ultrahigh-speed property mapping, enabled by Performech III control technology, introduces trigger points and seamless switching from load to displacement control within a single experiment. XPM II on the Hysitron TI 990 TriboIndenter can reach 12 indents/second, up to 1000x faster data acquisition than traditional quasistatic nanoindentation testing.

Bruker’s Hysitron PI Series SEM PicoIndenters make it easy for you to conduct in-situ mechanical experiments in your electron microscope. Our unique transducer design delivers unmatched stability throughout your experiments, resulting in precise data even at the nanoscale. The achievable XPM rates for our most popular in-situ microscopy systems are:

Hysitron PI 89 SEM PicoIndenter—PI 89 now features the next-generation controller, Performech III, which enhances both speed and versatility to deliver high-throughput experimental results at room temperature, cryogenic temperatures, and elevated temperatures. The increased number of data acquisition points and load-function segments within a single test enables more detailed mechanical characterization and larger-area property mapping.

PI 89 incorporates encoded stages with 1 nm resolution and a maximum sample travel range of 12 mm × 26 mm. The system enables rapid, high-resolution mechanical property mapping under both load- and displacement-controlled modes at speeds exceeding 1 indent per second.

Hysitron PI Envision SEM PicoIndenter—Property mapping is also available with PI Envision at both room temperature and elevated temperatures. PI Envision supports large-area, high-resolution property mapping. The system features encoded stages with 1 nm resolution and a maximum sample travel range of 12 mm × 12 mm. PI Envision supports high-resolution and displacement-controlled property mapping at speeds of up to 1 indent per second.