UK Surface Metrology Workshop
Accurate, consistent surface texture metrology is essential to product performance across a range of well-established and emerging fields.
This webinar focuses on surface profiling techniques, their most popular applications and newest potential uses, and how to correlate the areal feature parameters they measure with surface functionality. The recording also inc;udes real-time, in-lab practical sessions featuring Bruker's fully-automated ContourX-500 benchtop optical profiler.
This webinar is included in our Thin Film Characterization Knowledge Pack.
Discover the Ideal Tools & Techniques for Surface Texture Metrology
Held in collaboration with the University of Huddersfield and with the support of our guest speaker, Prof. Liam Blunt, Ph.D., Director of the Centre for Precision Technologies, this workshop explores the capabilities and applications of Bruker’s Stylus & Optical Profilers.
Find out more about the technology featured in this webinar or our other solutions for surface metrology:
Program Overview
| Title | Speaker(s) | Topic | Recording Length |
| Application of Areal Feature Parameters | Prof. Liam Blunt, University of Huddersfield | An exclusive presentation by Prof. Blunt on the application of areal feature parameters in relation to understanding surface functionality. | 35 min. |
| State-of-the-Art Surface Texture Metrology | Dr Samuel Lesko, Sr. Applications Dev. Manager, for Tribology, Stylus & Optical Profilers, Bruker | In-depth exploration of new developments relating to the WLI technique which enable its application in fields such as rough and steady samples and thin-film, especially in studies requiring large samples. | 25 min. |
| Practical Session 1: 3D Measurements | Dr Vishal Panchal, Application Scientist | In this real-time practical session, the ContourX-500 optical profiler is used to demonstrate 3D measurements including the surface roughness/waviness of a given sample and depth/volume of a scratch test. | 15 min. |
| Practical Session 2: Film Thickness Measurements | Dr Vishal Panchal, Application Scientist | In this real-time practical session, the ContourX-500 3D optical profiler is used to demonstrate film thickness measurements and explore the surfaces of the substrate and film coating from a single measurement. | 15 min. |
Featured Products and Technology
Guest Speaker
With introduction by Boumedienne Boudjelida, Sales Manager UK, Bruker.
