Bruker
Продукты и решения
Применения
Услуги
Новости и события
О нас
карьера
Electron Microscope Analyzers

QUANTAX EDS for TEM

Energy Dispersive X-ray Spectrometer for STEM, TEM and T-SEM

Nanoscale Element Mapping

Quantitative Element Mapping

QUANTAX EDS for TEM

Основные моменты

>15
years
Experience with silicon drift detectors in TEM
Detector materials and driving electronics are designed for fast, precise and reliable data acquisition and no interference with high-end TEM performance, even at atomic resolution.
80
keV
Unprecedented upper energy limit for element ID and quantification
With TEM-specific high energy electrons and thus higher energy element lines for quantitative EDS
1
atom
Single atom ID and atom column mapping
Single atom identification within seconds using the high solid angle XFlash 6T detectors in combination with high end high brightness cold FEG aberration corrected STEM

EDS Element Mapping in TEM, STEM and SEM (T-SEM) on the Nanometer Scale

The clear versatile measurement setup and slimline geometry ensure fast reliable TEM EDS data on a routine basis. Hyperspectral images using so-called HyperMaps or Spectrum Images are acquired. Spectra per pixel and all meta-data needed for correct quantitative analysis are saved for inspection and processing.

  • Slim-line design and geometrical optimization for each microscope pole piece type ensure maximum collection and take-off angle.
  • Helps avoid specimen tilt, absorption, shadowing and system peaks.
  • Windowless detectors for further increase of detection efficiency, particularly in the low energy region for K-lines of light elements and L-, M- and further lines of higher Z-elements.
  • Auto-retraction by default and customization ensure long detector life time and versatile experiments.
  • EDS features for in-situ experiments, such as temperature series, where we have to deal with a stream of changing data.
  • Comprehensive software suite ESPRIT for data analysis on- and off-line. 

Преимущества

Software for On- and Off-line TEM EDS

QUANTAX EDS for TEM includes a flexible and transparent analysis software package ESPRIT. Default and adjustable methods allow fast and comprehensive data mining of element mappings, so-called HyperMaps or spectrum images and the generation of quantitative element maps. Standard based and standardless quantification routines for spectra, objects, line scans and element mapping are included as well as PCA based phase analysis and automated statistical partical analysis. 

  • Off-line analysis software with personal hardware-key and/or LAN option for student or laboratory networks.
  • Open transparent user interface: what you see is what you get.
  • Clear setup, modification and save/reload of quantification routines for EDS data.
  • Two quantification methods for electron transparent specimens: Cliff-Lorimer- and Zeta-Factor-Method. 
  • Theoretical Cliff-Lorimer Factors can be calculated for any voltage, including low voltages on SEM (TEM in SEM), using a large steadily updated atomic data base.
  • Easy software-guided calibration of experimental Cliff-Lorimer- and Zeta-Factors using standard specimens.
  • If not all Zeta-factors can be covered by standards, the missing ones can be calculated using the existing Cliff-Lorimer-Factors.
  • Choice of background models: thin sample physical, mathematical, thick sample physical. 
  • Report generation and print formatting

Применения

What is your Analytical Challenge?

Bright field image and single element maps of a yeast cell

EDS for Life Science

EDS in S/TEM is particularly useful if many elements in a material have to be determined at once. This is the case for quite a few life science applications.
In-situ element map

In-situ Element Mapping at Elevated Temperatures

The use of heating holders, or any other in-situ reaction cells, which are suitable for electron microscopy and EDS, allows to monitor the effect of materials treatment in-situ or in-operando in the electron microscope. This means that information on changes in structure and element composition is available qualitatively and quantitavely with high spatial resolution.
HAADF image of Pd-Pt core shell particles

Qualitative and Quantitative Mapping of a Pd-Pt Core Shell Particle

Core shell particles play an increasingly important role in nanotechnology, particularily in catalysis. This application example presents element maps of a Pd-Pt core shell nano-particle.
Single silicon atom in graphene

Identifiying a Single Atom on Graphene

Not only is it the highest art of EDS to obtain spectra of a single atom, but it can also provide valuable new information on the excitation properties of specific elements.
Mixed element map of nanowires

Chemical Characterization of Nanowires

Nanostructures, such as nanowires and nanorods and functionalized nanovehicles are of growing interest for various applications in nanotechnology, be that nano-electronics or drug delivery in the human body.
High angle annular darkfield image of an interconnect structure

Chemical Composition of Semiconductor Interconnects

Standard energy dispersive X-ray spectroscopy (EDS or EDX) using detector areas of 30mm2 on conventional scanning transmission electron microscopes (STEM) can deliver element mappings with nm resolution within a few minutes. The condition is, that the detector head is small enough (in slim-line design) to get as close to the specimen for (high solid angle) and as high above the specimen (for high take-off angle) as possible. The latter helps to avoid shadowing and absorption effects.