Bruker Nano Analytics' product portfolio includes a unique range of analytical tools for materials characterization in electron microscopes:
Besides this unparalleled range of analytical tools for electron microscopes, Bruker also offers a variety of benchtop X-ray fluorescence micro analyzers (micro-XRF) for spatially resolved composition analysis and total reflection X-ray fluorescence (TXRF) instruments for trace element analysis for a multitude of applications in industry and research.
Last but not least, BNA's handheld/mobile/portable X-ray fluorescence spectrometers (handheld XRF) have the capability to non-destructively quantify or qualify nearly any element from magnesium to uranium (depending on specific instrument configurations), delivering fast, on-site elemental analysis in a broad range of application fields.
Visit the demo facilities in our headquarters in Berlin (Germany) or just take a virtual tour on our showroom to see and learn more about our analytical solutions. If you have any questions, please do not hesitate to contact our team of experts from sales or customer support.