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Electron Microscope Analyzers

QUANTAX EDS for SEM

The Solution for your Analytical Challenge - EDS for SEM, FIB and EPMA

The Standard in Energy Dispersive Spectrometry

Fast. Versatile. In Great Demand.

QUANTAX EDS for SEM

Highlights

600
kcps
Analytical throughput
Best analysis speed
121
eV
Peak resolution
Best energy resolution for light element analysis
4
Combined EDS detectors
Maximize throughput using multiple detectors or detector arrays

EDS with Slim-line Technology for Your SEM, FIB and EPMA

Once again Bruker sets standards in performance and functionality in energy-dispersive spectrometry for the scanning electron microscope. The new generation of QUANTAX EDS features the XFlash® 6 detector series with active areas from 10 to 100 mm2.

Generation 6 provides the hardware and software technology to deliver the fastest and most reliable results:

Save time - New slim-line technology detectors, large area SDDs, multiple detector control and high performance pulse processing get the job done faster

Save effort - Motorized detector movement and light weight design make detector handling easier

Gain more precision - Best energy resolution provides the highest quality spectra for precise analysis 

Gain more reliablity - The world's most comprehensive atomic database ensures most dependable low energy peak identification

Gain more accuracy - The most sophisticated algorithms for quantification and the unique combination of standardless and standard-based methods provide highest accuracy results

Benefits

Make your Element Analysis more Efficient!

The combination of an individual microscope adaptation, unmatched speed and precision leads to the most powerful EDS system for any lab. This sytem includes spectral imaging, making micro and nano analysis no longer a challenge.

The XFlash® detector family also offers optimized soltuions for TEM and STEM as well as the unique XFlash® FlatQUAD, a detector made to answer questions on tough samples.

Furthermore, the seamless integration of EDS together with EBSD, Micro-XRF and WDS in only one user interface ESPRIT provides the most comprehensive analysis platform for any SEM, FIB and EPMA.

Applications

What is your Analytical Challenge?

X-ray elemental maps of a mantle peridotite sample

Efficient X-ray Mapping of an Entire Geological Thin Section by SEM-based EDS

Elemental distribution of a whole mineralogical thin section can be achieved in few minutes only, with EDS mapping by controlling the beam and stage of scanning electron microscopes.
Mocs historic meteorite: Composite net intensity map showing sulfur and lead deposides in the cracks of the meteor

High Resolution X-ray Elemental Mapping of a Meteorite Specimen

Elemental distribution mapping with Scanning Electron Microscope does not require sample preparation when using Bruker's unique XFlash FlatQUAD EDS detector. Here we present results acquired on a meterorite specimen, for which any kind of sample preparation is forbidden.
EDS spectrum of HfB2 acquired at 5 kV; Inset picture shows magnified spectra in the 100 - 250 eV region

Low-kV Quantification of Refractory Borides for High Temperature Applications

Ultra-high temperature (UHT) boride ceramics are a class of refractory materials that are made for extreme environments.
Bismuth segregation in AgPbTeBi Thermoelectric materials

Resolving Bismuth Enriched Grain Boundaries in Thermoelectric Materials

Thermoelectric materials have versatile applications from energy generation to solid state cooling.
EDS map and SE image of coating layers on tungsten carbide cutting tools

TiCN Hard Coatings for Tungsten Carbide Cutting Tools

Functional thin and thick layers are technologically important since they enhance or change the surface properties of any material. However, the two-dimensional nature of these films and buried interfaces poses challenges in reliable analysis of these class of materials.
SE-image of a ternary alloy with rough sample topography and certified concentration values

EDS Quantification on Materials with Rough Topography

For reliable EDS quantification, the accurate knowledge of the sample and the detector geometry is imperative.

More Information

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