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XFlash® 6 | 10 – The Best Resolution SDD

XFlash® 6 | 10

The core piece of this latest generation X-ray detector is a silicon chip that functions according to the drift chamber principle.

Due to the special chip design with integrated charge amplifier the XFlash® can process very high count rates and at the same time displays an excellent energy resolution, unrivaled by any other silicon-based energy dispersive X-ray detector.

In summary, the XFlash® 6 | 10 offers the following advantages

  • Outstanding energy resolution (limited edition with 121 eV at Mn Kα, 38 eV at C Kα and 47 eV at F Kα available)
  • Other available resolutions are 123, 126 and 129 eV at Mn Kα
  • Extremely high pulse load capability
  • Excellent light element and low energy performance ( Be - Am element range)
  • No elaborate, vibration-generating cooling systems
  • Immediately available after power on
  • Low operating cost
  • Maintenance-free operation
  • Small dimensions, including slim-line technology finger
  • Low weight

Suggested areas of application for the XFlash® 6 | 10 are

  • EDS systems for SEM, microprobe, FIB-SEM (welded bellows available as an option)
  • Light element and low energy range analysis