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XFlash® 6T | 60

The Large Solid Angle SDD for TEM Analysis on the nm-Scale and Below

XFlash® 6T | 60

The medium active area 60 mm2 chip mounted in a slim-line detector finger provides a large solid angle and high take-off angle. The XFlash® 6T | 60 is therefore ideal for applications with relatively low X-ray yield, e.g. for atomic resolution spectrometry, experiments where a zone axis must be kept and the sample can therefore not be tilted,  and beam sensitive specimens (e.g. graphene, life science). The detector also delivers very good energy resolution with 126 eV at Mn Kα.

In summary, the XFlash® 6T | 60 offers the following advantages

  • Good energy resolution (126 eV at Mn Kα, 51 eV at C Kα and 60 eV at F Kα available)
  • Other available resolution is 129 eV at Mn Kα
  • Extremely high pulse load capability
  • Excellent light element and low energy performance (element range Be - Am)
  • Welded bellows as standard
  • No vibration-generating cooling systems
  • Immediately available after power on
  • Maintenance-free operation
  • Low operating cost
  • Small dimensions, including slim-line technology finger
  • Low weight
  • Windowless version available on request

Suggested areas of application for the XFlash® 6T | 60 are

  • Low X-ray yield applications on TEM and STEM, including aberration corrected electron microscopy