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QUANTAX with XFlash® 6T

Excellence in X-ray Analysis for the Transmission Electron Microscope


Icon Detector Areas

Choice of detector sizes

• 30 mm2 and 60 mm2 area detectors offer ideal solutions for nanoanalysis on TEM


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Icon Energy Resolution

Best energy resolution for best analytical results

• 126 eV premium
• 129 eV standard
• Resolutions specified exceeding ISO 15632:2012

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Icon High Speed Pulse Processing

Ultra high throughput for fastest measurements

• New signal processing unit with hybrid technology
• Various shaping times available
• Over 1,500 kcps input count rate
• Up to 600 kcps output count rate

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Icon Slim-line Detector Technology

Slim-line detector technology for even more counts and lower beam currents

• Shortest detector to sample distances for maximum solid angle

• Best available take-off angle for TEM

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Icon Compact and Light-weight Design

Compact design and low weight

• High precision slider with fully integrated motor for precise positioning
• Improved heat sink for stable measurement conditions
• Low weight design

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Download the XFlash® 6T | 30 spec sheet (PDF)

Download the XFlash® 6T | 60 spec sheet (PDF)

Download the XFlash® 6T | 100 spec sheet (PDF)