Dimension HPI AFM
Dimension HPI Overview | Industrial Atomic Force Microscope
Dimension XR from the leading SPM manufacturer
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Atomic Force Microscopes

High-Resolution AFM Systems Powered by PeakForce Tapping

High Resolution SPM
Bruker AFM

High-Resolution AFM Microscopes

As atomic force microscopy enters its fourth decade as a primary technique for enabling research of all levels, its high-resolution data has helped researchers across a nearly countless array of disciplines and applications. Bruker has been leading the expansion of atomic force microscope (AFM) capabilities since the very beginning, and our systems are the most cited AFMs in the world. Over the last year alone, we have partnered with researchers to develop innovative capabilities for life sciences, unmatched combinations of resolution and speed for materials research and industrial production, and new mechanical and electrical AFM modes for advanced nanoscale research.


In addition to taking the fullest advantage of such core imaging modes as Contact Mode and TappingMode™, Bruker’s high-resolution AFMs feature proprietary PeakForce Tapping® to enable new research with unique nanomechanical, electrical, and chemical measurements as shown in well over 1000 peer reviewed publications . And, as the only AFM manufacturer with a state-of-the-art probes nanofabrication facility and world-wide, application-specific customer support, Bruker is uniquely positioned to provide the equipment, guidance, and support for all your nanoscale research needs.

nano research, afm topography
Multimode 8-HR AFM
High Resolution AFM

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