Large sample atomic force microscopes

Large-Sample AFMs

Only Bruker’s large-sample atomic force microscopes deliver point defect resolution with open stage flexibility. Featuring high-resolution AFM performance normally associated with the best small-sample systems, these high-speed AFMs have been designed from top to bottom to deliver the lowest drift and noise. Researchers are now able to achieve high-resolution artifact-free images in minutes instead of hours. Utilizing exclusive PeakForce Tapping, Bruker’s large-sample AFMs go beyond topography to provide quantitative nanomechanical and nanoelectrical data of real-time changes.

FastScan 230x187

Dimension FastScan

Flagship AFM for Nanoscale Research

 

 

Icon 230x187

Dimension Icon

World's Most Utilized Large-Sample AFM

Edge Large Sample AFM 230x187

Dimension Edge

The Best Value High-Performance AFM