電子顕微鏡用分析装置

独創的な電子顕微鏡用分析ツール

ブルカーの電子顕微鏡用分析装置（SEM搭載のEDS、EBSD、マイクロXRF）は、現在利用可能な材料の組成および構造解析において、最も包括的な分析機能を提供します。これらすべての技術をESPRITソフトウェアに完全に統合することで、相互に補完し合うこれらの手法で得られたデータを容易に組み合わせ、最良の結果を得ることができます。

QUANTAX EBSD

QUANTAX EBSD system with eWARP、史上最速かつ最高感度のEBSDシステム

詳細はこちら

QUANTAX FlatQUAD

X線検出における最高の効率 - これまで困難だった分析も簡単にする、画期的な4チャンネルEDS検出器。

詳細はこちら

解析ソフトウェア

元素分析および微量分析について詳しくはこちら

EDS - An Introduction to Energy Dispersive Spectroscopy

EDS is a common microanalytical technique used for the elemental analysis of samples under an electron microscope. Find out more about how EDS works and how it can be used!

詳細はこちら

EBSD - An Introduction to Electron Backscatter Diffraction

EBSD is powerful, SEM-based technique used to determine a material's microstructure. Find out here the science behind EBSD and what is possible using the latest detector technology.

詳細はこちら

Trace Element Map of Ore - Zinc, Iron, Lead, Cadmium

Full Range EDS - Augmenting EDS with micro-XRF

Full Range EDS allows users to overcome the limits of conventional EDS. Using a Full Range EDS system trace element analysis, layer analysis and the identification of high-energy elemental lines is possible.

詳細はこちら

EDS map showing Ta and Si distribution - the results are similar to those acheived using WDS and are collected in less time.

Analytical Alternatives to WDS for Elemental Analysis on SEM

Many researchers use Wavelength Dispersive Spectroscopy (WDS) to overcome challenges such as elemental peak overlaps, low signal intensities or to perform analysis at low kV.

Developments in EDS peak deconvolution routines in conjunction with modern windowless detectors and micro-XRF on SEM now mean that these challenges can be overcome without the limitations of WDS analysis.

詳細はこちら